@article{(International Science Index):http://iastem.com/publications/4341, author = {Tim Giesen and Christian Fischmann and Fabian Böttinger and Alexander Ehm and Alexander Verl}, email = {Tim.Giesen@ipa.fraunhofer.de} , title = {Development and Optimization of Automated Dry-Wafer Separation}, country = {Germany}, institution={Fraunhofer IPA}, abstract = {In a state-of-the-art industrial production line of photovoltaic products the handling and automation processes are of particular importance and implication. While processing a fully functional crystalline solar cell an as-cut photovoltaic wafer is subject to numerous repeated handling steps. With respect to stronger requirements in productivity and decreasing rejections due to defects the mechanical stress on the thin wafers has to be reduced to a minimum as the fragility increases by decreasing wafer thicknesses. In relation to the increasing wafer fragility, researches at the Fraunhofer Institutes IPA and CSP showed a negative correlation between multiple handling processes and the wafer integrity. Recent work therefore focused on the analysis and optimization of the dry wafer stack separation process with compressed air. The achievement of a wafer sensitive process capability and a high production throughput rate is the basic motivation in this research.}, journal = {International Journal of Mechanical, Aerospace, Industrial, Mechatronic and Manufacturing Engineering}, volume = {6}, number = {1}, year = {2012}, pages = {108 - 114}, ee = {http://iastem.com/publications/4341}, url = {http://iastem.com/Publications?p=61}, bibsource = {http://iastem.com/Publications}, issn = {1307-6892}, publisher = {International Science Index}, index = {International Science Index 61, Industrial and Manufacturing Engineering, 2012}, }